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PLPL-VIO: A Novel Probabilistic Line Measurement Model for ..:
, In:
2023 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)
,
Xu, Zewen
;
Wei, Hao
;
Tang, Fulin
... - p. 5211-5218 , 2023
Link:
https://doi.org/10.1109/IROS55552.2023.10342387
RT T1 <cTitle>2023 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)</cTitle>: T1 <Title>PLPL-VIO: A Novel Probabilistic Line Measurement Model for Point-Line-Based Visual-Inertial Odometry</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10342387&Exemplar=1&LAN=DE A1 Xu, Zewen A1 Wei, Hao A1 Tang, Fulin A1 Zhang, Yidi A1 Wu, Yihong A1 Ma, Gang A1 Wu, Shuzhe A1 Jin, Xin YR 2023 SN 2153-0866 K1 Weight measurement K1 Measurement errors K1 Uncertainty K1 Three-dimensional displays K1 Simultaneous localization and mapping K1 Measurement uncertainty K1 Probabilistic logic SP 5211 OP 5218 LK http://dx.doi.org/https://doi.org/10.1109/IROS55552.2023.10342387 DO https://doi.org/10.1109/IROS55552.2023.10342387 SF ELIB - SuUB Bremen
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