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1 Ergebnisse
1
Temperature-induced step-like enhancement of drain current ..:
, In:
2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)
,
De Stefano, Sebastiano
;
Durante, Ofelia
;
Giubileo, Filippo
... - p. 339-340 , 2023
Link:
https://doi.org/10.1109/NMDC57951.2023.10343986
RT T1 <cTitle>2023 IEEE Nanotechnology Materials and Devices Conference (NMDC)</cTitle>: T1 <Title>Temperature-induced step-like enhancement of drain current in a two-dimensional ReS₂ field-effect transistor</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10343986&Exemplar=1&LAN=DE A1 De Stefano, Sebastiano A1 Durante, Ofelia A1 Giubileo, Filippo A1 Faella, Enver A1 Intonti, Kimberly A1 Kumar, Arun A1 Viscardi, Loredana A1 Craciun, Monika A1 Russo, Saverio A1 Di Bartolomeo, Antonio YR 2023 SN 2473-0718 K1 Temperature K1 Field effect transistors K1 Voltage K1 Logic gates K1 Tunneling K1 Rhenium K1 Nanotechnology SP 339 OP 340 LK http://dx.doi.org/https://doi.org/10.1109/NMDC57951.2023.10343986 DO https://doi.org/10.1109/NMDC57951.2023.10343986 SF ELIB - SuUB Bremen
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