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1
Methodology of Circuit Modeling of Charge-Sensitive Amplifi..:
, In:
2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE)
,
Dvornikov, Oleg V.
;
Chumakov, Vladislav E.
;
Tchekhovsky, Vladimir A.
.. - p. 60-65 , 2023
Link:
https://doi.org/10.1109/APEIE59731.2023.10347861
RT T1
2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE)
: T1
Methodology of Circuit Modeling of Charge-Sensitive Amplifiers Based on Wide-Band-Gap (GaAs, GaN) D-FETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10347861&Exemplar=1&LAN=DE A1 Dvornikov, Oleg V. A1 Chumakov, Vladislav E. A1 Tchekhovsky, Vladimir A. A1 Kleimenkin, Dmitriy V. A1 Prokopenko, Nikolay N. YR 2023 SN 2473-8573 K1 Temperature sensors K1 Resistors K1 Temperature distribution K1 Power demand K1 Gallium arsenide K1 Field effect transistors K1 Signal processing K1 Charge sensitive amplifier K1 GaAs K1 GaN K1 HEMT K1 depletion mode type FET SP 60 OP 65 LK http://dx.doi.org/https://doi.org/10.1109/APEIE59731.2023.10347861 DO https://doi.org/10.1109/APEIE59731.2023.10347861 SF ELIB - SuUB Bremen
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