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1 Ergebnisse
1
Novel Feature Extraction Enhances YOLO on FOCoS RDL Recogni..:
, In:
2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Fang, Jen-Kuang
;
Lu, Wen-Long
;
Hung, Chao-Kai
.. - p. 168-170 , 2023
Link:
https://doi.org/10.1109/IMPACT59481.2023.10348705
RT T1 <cTitle>2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)</cTitle>: T1 <Title>Novel Feature Extraction Enhances YOLO on FOCoS RDL Recognition</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10348705&Exemplar=1&LAN=DE A1 Fang, Jen-Kuang A1 Lu, Wen-Long A1 Hung, Chao-Kai A1 Yang, Peng A1 Chang, Chien-Wei YR 2023 SN 2150-5942 K1 Integrated circuits K1 YOLO K1 Integrated optics K1 Sensitivity K1 Multichip modules K1 Production K1 Feature extraction K1 redistribution layers K1 fan out chip on substrate K1 automated optical inspection K1 edge feature extraction K1 you only look once K1 artificial intelligence SP 168 OP 170 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT59481.2023.10348705 DO https://doi.org/10.1109/IMPACT59481.2023.10348705 SF ELIB - SuUB Bremen
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