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1 Ergebnisse
1
Optimize Stencil Apertures to Eliminate SMT Solder Defects ..:
, In:
2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Hong, Ling-Ying
;
Li, Yun-Tsung
- p. 312-316 , 2023
Link:
https://doi.org/10.1109/IMPACT59481.2023.10348729
RT T1
2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
: T1
Optimize Stencil Apertures to Eliminate SMT Solder Defects by Shadow Moiré for Warpage Measurement
UL https://suche.suub.uni-bremen.de/peid=ieee-10348729&Exemplar=1&LAN=DE A1 Hong, Ling-Ying A1 Li, Yun-Tsung YR 2023 SN 2150-5942 K1 Temperature measurement K1 Micromechanical devices K1 Process control K1 Production K1 Apertures K1 Packaging K1 Market research SP 312 OP 316 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT59481.2023.10348729 DO https://doi.org/10.1109/IMPACT59481.2023.10348729 SF ELIB - SuUB Bremen
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