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1 Ergebnisse
1
Chipset Pin Pattern Design Impact on High-Speed Channel Cha..:
, In:
2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Hsu, Jimmy
;
Ho, Brian
;
Ho, Chiew Yee
... - p. 203-206 , 2023
Link:
https://doi.org/10.1109/IMPACT59481.2023.10348748
RT T1 <cTitle>2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)</cTitle>: T1 <Title>Chipset Pin Pattern Design Impact on High-Speed Channel Characteristics and Electrical Validation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10348748&Exemplar=1&LAN=DE A1 Hsu, Jimmy A1 Ho, Brian A1 Ho, Chiew Yee A1 Chang, Cheng-En A1 Chang, Ryan A1 Zhang, Xinjun A1 Li, Weizhe A1 Xue, Harrison YR 2023 SN 2150-5942 K1 Micromechanical devices K1 Degradation K1 Systematics K1 Resonant frequency K1 Crosstalk K1 Packaging K1 Pins SP 203 OP 206 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT59481.2023.10348748 DO https://doi.org/10.1109/IMPACT59481.2023.10348748 SF ELIB - SuUB Bremen
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