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Low Temperature Double Pulse Test Platform for Testing Powe..:

, In: 2023 18th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT),
Wu, Chih-Chiang ; Rout, Uma Sankar - p. 82-85 , 2023
Link: https://doi.org/10.1109/IMPACT59481.2023.10348830