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1 Ergebnisse
1
Analysis and Characterization of Defects in FeFETs:
, In:
2023 IEEE International Test Conference (ITC)
,
Thapar, Dhruv
;
Thomann, Simon
;
Chaudhuri, Arjun
.. - p. 256-265 , 2023
Link:
https://doi.org/10.1109/ITC51656.2023.00042
RT T1 <cTitle>2023 IEEE International Test Conference (ITC)</cTitle>: T1 <Title>Analysis and Characterization of Defects in FeFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10350046&Exemplar=1&LAN=DE A1 Thapar, Dhruv A1 Thomann, Simon A1 Chaudhuri, Arjun A1 Amrouch, Hussam A1 Chakrabarty, Krishnendu YR 2023 SN 2378-2250 K1 Fabrication K1 Solid modeling K1 Computational modeling K1 Machine learning K1 Predictive models K1 Iron K1 Circuit faults K1 Fault characterization K1 FeFET K1 machine learning K1 manufacturing defects SP 256 OP 265 LK http://dx.doi.org/https://doi.org/10.1109/ITC51656.2023.00042 DO https://doi.org/10.1109/ITC51656.2023.00042 SF ELIB - SuUB Bremen
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