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1 Ergebnisse
1
Enhancing Good-Die-in-Bad-Neighborhood Methodology with Waf..:
, In:
2023 IEEE International Test Conference (ITC)
,
Liu, Ching-Min
;
Yen, Chia-Heng
;
Lee, Shu-Wen
.. - p. 357-366 , 2023
Link:
https://doi.org/10.1109/ITC51656.2023.00053
RT T1
2023 IEEE International Test Conference (ITC)
: T1
Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information
UL https://suche.suub.uni-bremen.de/peid=ieee-10351069&Exemplar=1&LAN=DE A1 Liu, Ching-Min A1 Yen, Chia-Heng A1 Lee, Shu-Wen A1 Wu, Kai-Chiang A1 Chao, Mango Chia-Tso YR 2023 SN 2378-2250 K1 Measurement K1 Costs K1 Instruments K1 Semiconductor device reliability K1 Semiconductor device manufacture K1 Silicon K1 Pattern recognition SP 357 OP 366 LK http://dx.doi.org/https://doi.org/10.1109/ITC51656.2023.00053 DO https://doi.org/10.1109/ITC51656.2023.00053 SF ELIB - SuUB Bremen
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