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1 Ergebnisse
1
A New Framework for RTL Test Points Insertion Facilitating ..:
, In:
2023 IEEE International Test Conference (ITC)
,
Iwata, Hiroyuki
;
Maeda, Yoichi
;
Matsushima, Jun
... - p. 1-10 , 2023
Link:
https://doi.org/10.1109/ITC51656.2023.00010
RT T1
2023 IEEE International Test Conference (ITC)
: T1
A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy
UL https://suche.suub.uni-bremen.de/peid=ieee-10351086&Exemplar=1&LAN=DE A1 Iwata, Hiroyuki A1 Maeda, Yoichi A1 Matsushima, Jun A1 Laouamri, Oussama A1 Khanna, Naveen A1 Mayer, Jeff A1 Mukherjee, Nilanjan YR 2023 SN 2378-2250 K1 Costs K1 Discrete Fourier transforms K1 Logic gates K1 Complexity theory K1 Timing K1 Registers K1 Task analysis K1 test points K1 RTL design K1 embedded-test K1 built-in self-test K1 scan-based testing K1 test application time SP 1 OP 10 LK http://dx.doi.org/https://doi.org/10.1109/ITC51656.2023.00010 DO https://doi.org/10.1109/ITC51656.2023.00010 SF ELIB - SuUB Bremen
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