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1 Ergebnisse
1
Estimating the Failures and Silent Errors Rates of CPUs Acr..:
, In:
2023 IEEE International Test Conference (ITC)
,
Gizopoulos, Dimitris
;
Papadimitriou, George
;
Chatzopoulos, Odysseas
- p. 377-382 , 2023
Link:
https://doi.org/10.1109/ITC51656.2023.00056
RT T1
2023 IEEE International Test Conference (ITC)
: T1
Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures
UL https://suche.suub.uni-bremen.de/peid=ieee-10351088&Exemplar=1&LAN=DE A1 Gizopoulos, Dimitris A1 Papadimitriou, George A1 Chatzopoulos, Odysseas YR 2023 SN 2378-2250 K1 Microarchitecture K1 Error analysis K1 Microprocessors K1 Instruction sets K1 Focusing K1 Reliability engineering K1 Hardware K1 Reliability K1 soft errors K1 transient faults K1 permanent faults K1 silent data corruptions K1 failure rates K1 instruction set architectures K1 x86 K1 Arm K1 RISC-V K1 CPU K1 microarchitecture-level fault injection SP 377 OP 382 LK http://dx.doi.org/https://doi.org/10.1109/ITC51656.2023.00056 DO https://doi.org/10.1109/ITC51656.2023.00056 SF ELIB - SuUB Bremen
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