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1 Ergebnisse
1
An Optimized Measurement Strategy for 3D Electrical Capacit..:
, In:
2023 IEEE International Conference on Imaging Systems and Techniques (IST)
,
Wang, Ying
;
Lu, Xupeng
;
Sun, Jiangtao
.. - p. 1-6 , 2023
Link:
https://doi.org/10.1109/IST59124.2023.10355691
RT T1
2023 IEEE International Conference on Imaging Systems and Techniques (IST)
: T1
An Optimized Measurement Strategy for 3D Electrical Capacitance Tomography
UL https://suche.suub.uni-bremen.de/peid=ieee-10355691&Exemplar=1&LAN=DE A1 Wang, Ying A1 Lu, Xupeng A1 Sun, Jiangtao A1 Xu, Lijun A1 Sun, Shijie YR 2023 SN 2832-4234 K1 Electrodes K1 Three-dimensional displays K1 Sensitivity K1 Dynamic range K1 Hardware K1 Capacitance measurement K1 Electrical capacitance tomography K1 3D imaging K1 rapid sampling K1 process tomography SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IST59124.2023.10355691 DO https://doi.org/10.1109/IST59124.2023.10355691 SF ELIB - SuUB Bremen
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