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1 Ergebnisse
1
Characterizing TeO2 Formation in CdTe Devices Using Transmi..:
, In:
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
,
Farrell, John
;
Bastola, Ebin
;
Jamarkattel, Manoj
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/PVSC48320.2023.10359610
RT T1
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
: T1
Characterizing TeO2 Formation in CdTe Devices Using Transmission Electron Microscopy
UL https://suche.suub.uni-bremen.de/peid=ieee-10359610&Exemplar=1&LAN=DE A1 Farrell, John A1 Bastola, Ebin A1 Jamarkattel, Manoj A1 Heben, Michael A1 Sampath, Walajabad S. A1 Sites, James A1 Klie, Robert F. YR 2023 K1 Performance evaluation K1 Scanning electron microscopy K1 II-VI semiconductor materials K1 Transmission electron microscopy K1 Photovoltaic cells K1 Microscopy K1 Thin film devices K1 CdTe K1 TeO2 K1 Thin Film K1 HRSTEM K1 XEDS K1 Back Contact SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/PVSC48320.2023.10359610 DO https://doi.org/10.1109/PVSC48320.2023.10359610 SF ELIB - SuUB Bremen
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