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1 Ergebnisse
1
Analysis of Thermal Behavior and Reliability of Bare Die Di..:
, In:
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
,
Alanis, Luis Eduardo
;
Weber, Julian
;
Romer, Pascal
... - p. 1-6 , 2023
Link:
https://doi.org/10.1109/PVSC48320.2023.10359705
RT T1
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
: T1
Analysis of Thermal Behavior and Reliability of Bare Die Diodes Embedded Within PV Modules as Bypass Devices
UL https://suche.suub.uni-bremen.de/peid=ieee-10359705&Exemplar=1&LAN=DE A1 Alanis, Luis Eduardo A1 Weber, Julian A1 Romer, Pascal A1 Schuler, Marc Andre A1 Winkler, Louisa A1 Steinebrunner, Udo A1 Heinrich, Martin A1 Neuhaus, Dirk Holger YR 2023 K1 Photovoltaic systems K1 Heating systems K1 Geometry K1 Degradation K1 Temperature K1 Bills of materials K1 Semiconductor diodes K1 bypass diode K1 bare die diode K1 heat dissipation K1 partial shading K1 diode temperature K1 hot spot K1 shading SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/PVSC48320.2023.10359705 DO https://doi.org/10.1109/PVSC48320.2023.10359705 SF ELIB - SuUB Bremen
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