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1 Ergebnisse
1
Evaluation of Process Damage to Crystalline Silicon by Tran..:
, In:
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
,
Kojima, Haruki
;
Nishihara, Tappei
;
Ito, Yuta
... - p. 1-3 , 2023
Link:
https://doi.org/10.1109/PVSC48320.2023.10359745
RT T1
2023 IEEE 50th Photovoltaic Specialists Conference (PVSC)
: T1
Evaluation of Process Damage to Crystalline Silicon by Transparent Conductive Oxide Film Deposition
UL https://suche.suub.uni-bremen.de/peid=ieee-10359745&Exemplar=1&LAN=DE A1 Kojima, Haruki A1 Nishihara, Tappei A1 Ito, Yuta A1 Lee, Hyunju A1 Gotoh, Kazuhiro A1 Usami, Noritaka A1 Hara, Tomohiko A1 Nakamura, Kyotaro A1 Ohsita, Yoshio A1 Ogura, Atsushi YR 2023 K1 Spectroscopy K1 Impurities K1 Photovoltaic cells K1 Indium tin oxide K1 Plasmas K1 Charge carrier lifetime K1 Carbon SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/PVSC48320.2023.10359745 DO https://doi.org/10.1109/PVSC48320.2023.10359745 SF ELIB - SuUB Bremen
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