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Defect Spectroscopy of MBE-grown GaAs0.51Sb0.49 pin Infrare..:
, In:
2023 IEEE Photonics Conference (IPC)
,
Adams, Rachel L.
;
Jung, Hyemin
;
Gajowski, Nathan
... - p. 1-2 , 2023
Link:
https://doi.org/10.1109/IPC57732.2023.10360761
RT T1
2023 IEEE Photonics Conference (IPC)
: T1
Defect Spectroscopy of MBE-grown GaAs0.51Sb0.49 pin Infrared Detectors on InP Substrates
UL https://suche.suub.uni-bremen.de/peid=ieee-10360761&Exemplar=1&LAN=DE A1 Adams, Rachel L. A1 Jung, Hyemin A1 Gajowski, Nathan A1 Lee, Seunghyun A1 Krishna, Sanjay A1 Ringel, Steven A. YR 2023 SN 2575-274X K1 Infrared detectors K1 Pins K1 III-V semiconductor materials K1 Deep level transient spectroscopy K1 Indium phosphide K1 Substrates K1 Photonics SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IPC57732.2023.10360761 DO https://doi.org/10.1109/IPC57732.2023.10360761 SF ELIB - SuUB Bremen
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