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1 Ergebnisse
1
Clustering Algorithm for the Screening of SiC MOSFETs Conne..:
, In:
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Lv, Fang
;
Mao, Saijun
;
Lei, Guangyin
... - p. 6437-6443 , 2023
Link:
https://doi.org/10.1109/ECCE53617.2023.10362020
RT T1 <cTitle>2023 IEEE Energy Conversion Congress and Exposition (ECCE)</cTitle>: T1 <Title>Clustering Algorithm for the Screening of SiC MOSFETs Connected in Parallel</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10362020&Exemplar=1&LAN=DE A1 Lv, Fang A1 Mao, Saijun A1 Lei, Guangyin A1 Tan, Qiuyan A1 Yang, Shuhao A1 Ding, Yujie YR 2023 SN 2329-3748 K1 Semiconductor device modeling K1 Resistance K1 MOSFET K1 Manufacturing processes K1 Silicon carbide K1 Statistical analysis K1 Clustering algorithms K1 classification K1 static characteristics K1 parallel-connection K1 current sharing K1 DBSCAN K1 SiC MOS-FET SP 6437 OP 6443 LK http://dx.doi.org/https://doi.org/10.1109/ECCE53617.2023.10362020 DO https://doi.org/10.1109/ECCE53617.2023.10362020 SF ELIB - SuUB Bremen
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