I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Static Characterization of Discrete MOSFETs after Rotationa..:
, In:
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Vannest, Jeremiah
;
Adamson, Zachary
;
Wolf, Kevin
... - p. 5784-5788 , 2023
Link:
https://doi.org/10.1109/ECCE53617.2023.10362092
RT T1 <cTitle>2023 IEEE Energy Conversion Congress and Exposition (ECCE)</cTitle>: T1 <Title>Static Characterization of Discrete MOSFETs after Rotational Stress Testing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10362092&Exemplar=1&LAN=DE A1 Vannest, Jeremiah A1 Adamson, Zachary A1 Wolf, Kevin A1 Luscher, Anthony A1 Zhang, Julia A1 Liu, Shengyi A1 Gao, Lijun YR 2023 SN 2329-3748 K1 Temperature measurement K1 Temperature sensors K1 MOSFET K1 Voltage measurement K1 Silicon carbide K1 Threshold voltage K1 Stress K1 rotating power electronics K1 SiC K1 Power MOSFET SP 5784 OP 5788 LK http://dx.doi.org/https://doi.org/10.1109/ECCE53617.2023.10362092 DO https://doi.org/10.1109/ECCE53617.2023.10362092 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
