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1 Ergebnisse
1
Reliability Analysis of a Resilient Power Electronics Syste..:
, In:
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Gonzalez-Rivera, Juan
;
Cardenas, Victor
;
Yepez, Israel
.. - p. 3529-3536 , 2023
Link:
https://doi.org/10.1109/ECCE53617.2023.10362112
RT T1 <cTitle>2023 IEEE Energy Conversion Congress and Exposition (ECCE)</cTitle>: T1 <Title>Reliability Analysis of a Resilient Power Electronics System Based on a Multi-Port Converter Using a Markov Model</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10362112&Exemplar=1&LAN=DE A1 Gonzalez-Rivera, Juan A1 Cardenas, Victor A1 Yepez, Israel A1 Gonzalez-Garcia, Mario A1 Hernandez, Rafael YR 2023 SN 2329-3748 K1 Analytical models K1 Solar energy K1 Markov processes K1 Power electronics K1 Software K1 Behavioral sciences K1 Software reliability K1 Reliability K1 Stochastic process K1 Electric resilience K1 Markov model SP 3529 OP 3536 LK http://dx.doi.org/https://doi.org/10.1109/ECCE53617.2023.10362112 DO https://doi.org/10.1109/ECCE53617.2023.10362112 SF ELIB - SuUB Bremen
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