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1 Ergebnisse
1
A Digital Gate Driver IC with Active Gate Waveform Calibrat..:
, In:
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Kawai, Shusuke
;
Ueno, Takeshi
;
Miyazaki, Koutaro
.. - p. 5414-5418 , 2023
Link:
https://doi.org/10.1109/ECCE53617.2023.10362369
RT T1 <cTitle>2023 IEEE Energy Conversion Congress and Exposition (ECCE)</cTitle>: T1 <Title>A Digital Gate Driver IC with Active Gate Waveform Calibration Technique Achieving Switching Loss Reduction by 24% and DESAT Turn-off Arbitrary Waveform Memory for Overcurrent Protection Targeting 1200V SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10362369&Exemplar=1&LAN=DE A1 Kawai, Shusuke A1 Ueno, Takeshi A1 Miyazaki, Koutaro A1 Onizuka, Kohei A1 Ishihara, Hiroaki YR 2023 SN 2329-3748 K1 Integrated circuits K1 Silicon carbide K1 Surge protection K1 Switching loss K1 Logic gates K1 Pulse width modulation K1 Gate drivers K1 Active gate drive K1 SiC-MOSFETs K1 Ringing K1 Calibration SP 5414 OP 5418 LK http://dx.doi.org/https://doi.org/10.1109/ECCE53617.2023.10362369 DO https://doi.org/10.1109/ECCE53617.2023.10362369 SF ELIB - SuUB Bremen
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