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1 Ergebnisse
1
Improved Sensing Circuit for On-State Resistance Measuremen..:
, In:
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
,
Sayed, Hussain
;
Krishnamoorthy, Harish Sarma
- p. 6133-6138 , 2023
Link:
https://doi.org/10.1109/ECCE53617.2023.10362473
RT T1
2023 IEEE Energy Conversion Congress and Exposition (ECCE)
: T1
Improved Sensing Circuit for On-State Resistance Measurement of High and Low-Side GaN FETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10362473&Exemplar=1&LAN=DE A1 Sayed, Hussain A1 Krishnamoorthy, Harish Sarma YR 2023 SN 2329-3748 K1 Voltage measurement K1 Power measurement K1 Current measurement K1 Thermal resistance K1 Field effect transistors K1 Silicon K1 Sensors K1 Gallium Nitride (GaN) devices K1 on-state voltage measurement K1 dynamic on-state resistance K1 reliability K1 and bootstrap-based active clamp voltage SP 6133 OP 6138 LK http://dx.doi.org/https://doi.org/10.1109/ECCE53617.2023.10362473 DO https://doi.org/10.1109/ECCE53617.2023.10362473 SF ELIB - SuUB Bremen
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