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1 Ergebnisse
1
Error Bits Recovering in 3D NAND Flash Memory: A Novel Stat..:
, In:
2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)
,
Zhao, Xiaohuan
;
Yang, Shaoqi
;
Xie, Kenie
... - p. 99-100 , 2023
Link:
https://doi.org/10.1109/ICTA60488.2023.10364308
RT T1 <cTitle>2023 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)</cTitle>: T1 <Title>Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10364308&Exemplar=1&LAN=DE A1 Zhao, Xiaohuan A1 Yang, Shaoqi A1 Xie, Kenie A1 Feng, Yang A1 Wang, Qianwen A1 Sang, Pengpeng A1 Zhan, Xuepeng A1 Wu, Jixuan A1 Chen, Jiezhi YR 2023 SN 2831-3968 K1 Degradation K1 Integrated circuit technology K1 Three-dimensional displays K1 Flash memories K1 3D NAND K1 cold data K1 flash memory K1 re-program SP 99 OP 100 LK http://dx.doi.org/https://doi.org/10.1109/ICTA60488.2023.10364308 DO https://doi.org/10.1109/ICTA60488.2023.10364308 SF ELIB - SuUB Bremen
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