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Sampling for a Stepped-Frequency Continuous-Wave Imaging Ra..:

, In: NAECON 2023 - IEEE National Aerospace and Electronics Conference,
Huebner, Andrew ; Saville, Michael A. ; Brown, Elliott R.. - p. 141-143 , 2023
Link: https://doi.org/10.1109/NAECON58068.2023.10366020