I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Extending DRSEM Inspection Capacities and Applications with..:
, In:
2023 International Workshop on Advanced Patterning Solutions (IWAPS)
,
Yu, Hao
;
Yan, Changlian
;
Zhang, Rongjia
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/IWAPS60466.2023.10366081
RT T1 <cTitle>2023 International Workshop on Advanced Patterning Solutions (IWAPS)</cTitle>: T1 <Title>Extending DRSEM Inspection Capacities and Applications with the Introduction of D2DB Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10366081&Exemplar=1&LAN=DE A1 Yu, Hao A1 Yan, Changlian A1 Zhang, Rongjia A1 Gan, Yuan A1 Ding, Nuo A1 Ding, Ming A1 Chen, Zhao A1 Luo, Xiaojun A1 Jiang, Junhai A1 Yu, Zongchang A1 Han, Chunying YR 2023 K1 Scanning electron microscopy K1 Systematics K1 Target recognition K1 Filtering K1 Conferences K1 Layout K1 Production K1 DRSEM K1 D2DB K1 detectability enhancements K1 application extension SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IWAPS60466.2023.10366081 DO https://doi.org/10.1109/IWAPS60466.2023.10366081 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
