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Design, reliability and qualification of photonic crossconn..:

, In: Optical Fiber Communication Conference and Exhibit,

De Dobbelaere, P. ; Gloeckner, S. ; Patra, S.... - p. 710,711 , 2002

Link: https://doi.org/10.1109/OFC.2002.1036666

RT 
T1 <cTitle>Optical Fiber Communication Conference and Exhibit</cTitle>: T1 <Title>Design, reliability and qualification of photonic crossconnects based on digital MEMS</Title>

UL https://suche.suub.uni-bremen.de/peid=ieee-1036666&Exemplar=1&LAN=DE
				
A1 De Dobbelaere, P.
A1 Gloeckner, S.
A1 Patra, S.
A1 Fan, L.
A1 Reiley, D.
A1 King, C.
A1 Yeh, T.
A1 Gritters, J.
A1 Loke, Y.
A1 Kruglick, E.
A1 Chen, R.
A1 Harburn, M.
A1 Gutierrez, S.
A1 Harisson, M.
A1 Marchand, P.
A1 Sharma, A.
A1 Vacar, D.
A1 Hirshkoff, J.
A1 Oviedo, A.
A1 Ford, J.
A1 Belenky, A.
A1 Fedoriouk, V.
A1 Ferrel, D.
A1 Gumuz, O.
A1 Keegan, P.
A1 Le, J.
A1 O'Connor, S.
A1 Rines, D.
A1 Tran, C.
A1 Vacar, C.
A1 Ward, J.
A1 Husain, A.
A1 Schmidtke, H.-J.
A1 Heppner, B.H.
YR 2002
K1 Qualifications
K1 Micromechanical devices
K1 Optical fiber networks
K1 Optical switches
K1 Optical losses
K1 Telecommunication network reliability
K1 Optical fiber polarization
K1 Optical crosstalk
K1 Performance loss
K1 Insertion loss
SP 710,711
LK http://dx.doi.org/https://doi.org/10.1109/OFC.2002.1036666
DO https://doi.org/10.1109/OFC.2002.1036666
SF ELIB - SuUB Bremen

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