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1 Ergebnisse
1
MicroKGCL: A Knowledge Graph for Root Cause Localization of..:
, In:
2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS)
,
Yao, Xin-Wei
;
Lu, Qi-Chao
;
Li, Qiang
.. - p. 628-637 , 2023
Link:
https://doi.org/10.1109/QRS60937.2023.00067
RT T1 <cTitle>2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS)</cTitle>: T1 <Title>MicroKGCL: A Knowledge Graph for Root Cause Localization of Feedback Issues in Microservices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10366681&Exemplar=1&LAN=DE A1 Yao, Xin-Wei A1 Lu, Qi-Chao A1 Li, Qiang A1 Liu, Lin-Lang A1 Zhu, Zhi-Chao YR 2023 SN 2693-9177 K1 Location awareness K1 Visualization K1 Microservice architectures K1 Knowledge graphs K1 Software quality K1 Production K1 Feature extraction K1 microservices K1 root cause localization K1 user feedback K1 knowledge graph K1 multi-modal SP 628 OP 637 LK http://dx.doi.org/https://doi.org/10.1109/QRS60937.2023.00067 DO https://doi.org/10.1109/QRS60937.2023.00067 SF ELIB - SuUB Bremen
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