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1 Ergebnisse
1
Coupled Field–Circuit Modeling and Analysis for Interturn S..:
, In:
2023 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)
,
Wang, Weixiang
;
Yan, Chenguang
;
Liu, Qinzhi
... - p. 1-2 , 2023
Link:
https://doi.org/10.1109/ASEMD59061.2023.10368839
RT T1 <cTitle>2023 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)</cTitle>: T1 <Title>Coupled Field–Circuit Modeling and Analysis for Interturn Short-Circuit Faults in a DFIG</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10368839&Exemplar=1&LAN=DE A1 Wang, Weixiang A1 Yan, Chenguang A1 Liu, Qinzhi A1 Liu, Zhangheng A1 Zhang, Baohui A1 Shu, Jin A1 Zhao, Jikai YR 2023 K1 Analytical models K1 Short-circuit currents K1 Doubly fed induction generators K1 Superconductivity K1 Stators K1 Control systems K1 Regulation K1 doubly fed induction generators (DFIGs) K1 finite element modeling K1 short circuit currents SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/ASEMD59061.2023.10368839 DO https://doi.org/10.1109/ASEMD59061.2023.10368839 SF ELIB - SuUB Bremen
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