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1 Ergebnisse
1
An Analysis of the Influence of Orientation on Radiated Emi..:
, In:
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC)
,
Chen, Meishuang
;
Cui, Qiang
;
Zhu, Sai
.. - p. 1-3 , 2023
Link:
https://doi.org/10.1109/ISEMC58300.2023.10370335
RT T1 <cTitle>2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC)</cTitle>: T1 <Title>An Analysis of the Influence of Orientation on Radiated Emission Measurement with the TEM Cell</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10370335&Exemplar=1&LAN=DE A1 Chen, Meishuang A1 Cui, Qiang A1 Zhu, Sai A1 Fu, Jun A1 Liu, Zhe YR 2023 K1 Integrated circuits K1 Semiconductor device measurement K1 Current measurement K1 Printed circuits K1 Turning K1 Time measurement K1 Electromagnetics K1 TEM cell radiated emission K1 orientations K1 electric dipole SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ISEMC58300.2023.10370335 DO https://doi.org/10.1109/ISEMC58300.2023.10370335 SF ELIB - SuUB Bremen
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