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1 Ergebnisse
1
A Horn-Tip Ultrawideband E-Probe for Radiated EMI Measureme..:
, In:
2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC)
,
Khodeir, Mahmoud Mohammed Ahmed
;
Yan, Zhaowen
;
Jia, Yunxiang
. - p. 1-5 , 2023
Link:
https://doi.org/10.1109/ISEMC58300.2023.10370574
RT T1 <cTitle>2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC)</cTitle>: T1 <Title>A Horn-Tip Ultrawideband E-Probe for Radiated EMI Measurements Up To 50 GHz</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10370574&Exemplar=1&LAN=DE A1 Khodeir, Mahmoud Mohammed Ahmed A1 Yan, Zhaowen A1 Jia, Yunxiang A1 Ma, Zhangqiang YR 2023 K1 Sensitivity K1 Stripline K1 Electromagnetic interference K1 Electric variables measurement K1 Electromagnetic compatibility K1 Size measurement K1 Probes K1 Electric field probe K1 ultrawideband probe K1 high spatial resolution K1 EMC K1 EMI K1 near field measurement K1 horn-shaped tip SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/ISEMC58300.2023.10370574 DO https://doi.org/10.1109/ISEMC58300.2023.10370574 SF ELIB - SuUB Bremen
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