I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

JPEG Steganalysis Using Leaked Cover Thumbnails:

, In: 2023 IEEE International Workshop on Information Forensics and Security (WIFS),
Benes, Martin ; Lorch, Benedikt ; Bohme, Rainer - p. 1-6 , 2023
Link: https://doi.org/10.1109/WIFS58808.2023.10374587