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1 Ergebnisse
1
Fault simulation Framework using PyUVM:
, In:
2023 International Conference on Microelectronics (ICM)
,
Fayez, Mina Hanna
;
ElAdawy, Mohamed Ahmed
;
Sahyon, Micheal Safwat
... - p. 158-161 , 2023
Link:
https://doi.org/10.1109/ICM60448.2023.10378910
RT T1 <cTitle>2023 International Conference on Microelectronics (ICM)</cTitle>: T1 <Title>Fault simulation Framework using PyUVM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10378910&Exemplar=1&LAN=DE A1 Fayez, Mina Hanna A1 ElAdawy, Mohamed Ahmed A1 Sahyon, Micheal Safwat A1 Ahmed, Islam Osama A1 El-Din, Omar Hossam A1 ElShafie, Mohamed Ahmed A1 Taha, Mohamed Ayman A1 Talaat, Mohamed Gamal YR 2023 SN 2159-1679 K1 Integrated circuits K1 Fault diagnosis K1 Manufacturing processes K1 Distance measurement K1 Hazards K1 Behavioral sciences K1 Microelectronics K1 ICs K1 FuSa K1 E/E K1 UVM K1 ASILs K1 FMEDA K1 CoCotb K1 EDA K1 DUT K1 SV K1 GUI SP 158 OP 161 LK http://dx.doi.org/https://doi.org/10.1109/ICM60448.2023.10378910 DO https://doi.org/10.1109/ICM60448.2023.10378910 SF ELIB - SuUB Bremen
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