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1 Ergebnisse
1
Study on the Influence of Fin Width on the Characteristics ..:
, In:
2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)
,
Wang, Kai
;
Wu, Chang
;
Liu, Jielong
... - p. 01-03 , 2023
Link:
https://doi.org/10.1109/IMWS-AMP57814.2023.10381363
RT T1 <cTitle>2023 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)</cTitle>: T1 <Title>Study on the Influence of Fin Width on the Characteristics of T-Gate Fin HEMT</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10381363&Exemplar=1&LAN=DE A1 Wang, Kai A1 Wu, Chang A1 Liu, Jielong A1 Guo, Tao A1 Xing, Shaokun A1 Zeng, Yulei A1 Wang, Yu A1 Zhang, Tao A1 Xiong, Xin A1 Li, Chengcheng A1 Liu, An A1 Zhou, Rui A1 Wu, Jiayan A1 Huang, Zhen YR 2023 SN 2694-2992 K1 Radio frequency K1 Three-dimensional displays K1 Linearity K1 Logic gates K1 HEMTs K1 Heterojunctions K1 Threshold voltage SP 01 OP 03 LK http://dx.doi.org/https://doi.org/10.1109/IMWS-AMP57814.2023.10381363 DO https://doi.org/10.1109/IMWS-AMP57814.2023.10381363 SF ELIB - SuUB Bremen
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