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1 Ergebnisse
1
A New Temperature and Luminance Combined Degradation Model ..:
, In:
2023 7th International Conference on System Reliability and Safety (ICSRS)
,
Lee, Jun-Tae
;
Choi, Yo-Min
;
Kim, Sang-Dae
- p. 61-66 , 2023
Link:
https://doi.org/10.1109/ICSRS59833.2023.10381431
RT T1 <cTitle>2023 7th International Conference on System Reliability and Safety (ICSRS)</cTitle>: T1 <Title>A New Temperature and Luminance Combined Degradation Model to Estimate the Lifetime of OLED</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10381431&Exemplar=1&LAN=DE A1 Lee, Jun-Tae A1 Choi, Yo-Min A1 Kim, Sang-Dae YR 2023 K1 Degradation K1 Temperature distribution K1 Estimation K1 Organic light emitting diodes K1 Predictive models K1 Mathematical models K1 Data models K1 OLED K1 lifetime estimation K1 temperature and luminance combined degradation model K1 Arrhenius equation K1 stretched exponential decay model SP 61 OP 66 LK http://dx.doi.org/https://doi.org/10.1109/ICSRS59833.2023.10381431 DO https://doi.org/10.1109/ICSRS59833.2023.10381431 SF ELIB - SuUB Bremen
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