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Short-Circuit Ruggedness Characterization of State-of-the-A..:

, In: 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA),
Cong, Yizhou ; Jiang, Peiwen ; Wang, Ke... - p. 1-5 , 2023
Link: https://doi.org/10.1109/WiPDA58524.2023.10382189