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1 Ergebnisse
1
Impact of Process Variations on Back-Bias Effect in 100V p-..:
, In:
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
,
Cioni, M.
;
Giorgino, G.
;
Chini, A.
... - p. 1-5 , 2023
Link:
https://doi.org/10.1109/WiPDA58524.2023.10382224
RT T1
2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
: T1
Impact of Process Variations on Back-Bias Effect in 100V p-GaN Gate AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-10382224&Exemplar=1&LAN=DE A1 Cioni, M. A1 Giorgino, G. A1 Chini, A. A1 Marletta, G. A1 Miccoli, C. A1 Castagna, M. E. A1 Luongo, G. A1 Moschetti, M. A1 Tringali, C. A1 Iucolano, F. YR 2023 SN 2687-8577 K1 HEMTs K1 Logic gates K1 Conductivity K1 Transmission line measurements K1 Wide band gap semiconductors K1 Topology K1 Transistors K1 GaN HEMTs K1 Back-Effect K1 Vertical Leakage K1 2-DEG density K1 RON-degradation K1 VTH drift SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/WiPDA58524.2023.10382224 DO https://doi.org/10.1109/WiPDA58524.2023.10382224 SF ELIB - SuUB Bremen
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