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Static Noise Margin in 16 nm FinFET 6T and 8T SRAM Cells fo..:

, In: 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Stevenazzi, Lorenzo ; Baschirotto, Andrea ; Matteis, Marcello De - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICECS58634.2023.10382712