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Fast and Low-Error Prediction of Logic Gate Cell Characteri..:

, In: 2023 30th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Jacinto, Gabriel L. ; Schneider, Cinthia S. ; Zimpeck, Alexandra L... - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICECS58634.2023.10382896