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1 Ergebnisse
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Impacts of Embedded SCR/Schottky Parasitic on ESD Reliabili..:
, In:
2023 IEEE 5th Eurasia Conference on IOT, Communication and Engineering (ECICE)
,
Lin, Ting-En
;
Chen, Shen-Li
;
Liu, Zhi-Wei
. - p. 208-211 , 2023
Link:
https://doi.org/10.1109/ECICE59523.2023.10382987
RT T1
2023 IEEE 5th Eurasia Conference on IOT, Communication and Engineering (ECICE)
: T1
Impacts of Embedded SCR/Schottky Parasitic on ESD Reliability in the Drain End of High Voltage nLDMOS Devices
UL https://suche.suub.uni-bremen.de/peid=ieee-10382987&Exemplar=1&LAN=DE A1 Lin, Ting-En A1 Chen, Shen-Li A1 Liu, Zhi-Wei A1 Yang, Xiu-Yuan YR 2023 K1 Schottky diodes K1 Voltage K1 High-voltage techniques K1 Electrostatic discharges K1 Robustness K1 Discharges (electric) K1 Electrostatics K1 electrostatic discharge K1 holding voltage K1 laterally-diffused metal-oxide semiconductor K1 latch-up effect K1 silicon-controlled rectifier K1 Schottky diode SP 208 OP 211 LK http://dx.doi.org/https://doi.org/10.1109/ECICE59523.2023.10382987 DO https://doi.org/10.1109/ECICE59523.2023.10382987 SF ELIB - SuUB Bremen
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