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ESD-Robustness Study of High-voltage N-channel LDMOSs with ..:

, In: 2023 IEEE 5th Eurasia Conference on IOT, Communication and Engineering (ECICE),
Yang, Xiu-Yuan ; Chen, Shen-Li ; Lin, Ting-En - p. 193-196 , 2023
Link: https://doi.org/10.1109/ECICE59523.2023.10383010