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1 Ergebnisse
1
Predicting Patent Transfer in the Manufacturing Industry: A..:
, In:
2023 IEEE International Conference on Big Data (BigData)
,
Park, Hyeonmin
;
Kim, Jeongho
;
Cho, Eunbi
. - p. 6257-6259 , 2023
Link:
https://doi.org/10.1109/BigData59044.2023.10386639
RT T1 <cTitle>2023 IEEE International Conference on Big Data (BigData)</cTitle>: T1 <Title>Predicting Patent Transfer in the Manufacturing Industry: A Machine Learning Model for Patent Analytics Using BERT</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10386639&Exemplar=1&LAN=DE A1 Park, Hyeonmin A1 Kim, Jeongho A1 Cho, Eunbi A1 Oh, Joo Hee YR 2023 K1 Measurement K1 Manufacturing industries K1 Patents K1 Technological innovation K1 Data analysis K1 Technology transfer K1 Machine learning K1 Patent Analytics K1 USPTO K1 Technology Transfer K1 Manufacturing K1 BERT analysis K1 Machine Learning SP 6257 OP 6259 LK http://dx.doi.org/https://doi.org/10.1109/BigData59044.2023.10386639 DO https://doi.org/10.1109/BigData59044.2023.10386639 SF ELIB - SuUB Bremen
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