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1 Ergebnisse
1
Software Defect Prediction Using Machine Learning - A Syste..:
, In:
2023 20th International Computer Conference on Wavelet Active Media Technology and Information Processing (ICCWAMTIP)
,
Chengxiao, Yan
;
Owais, Jaweria
;
Ahmed, Awais
... - p. 1-9 , 2023
Link:
https://doi.org/10.1109/ICCWAMTIP60502.2023.10387043
RT T1
2023 20th International Computer Conference on Wavelet Active Media Technology and Information Processing (ICCWAMTIP)
: T1
Software Defect Prediction Using Machine Learning - A Systematic Literature Review
UL https://suche.suub.uni-bremen.de/peid=ieee-10387043&Exemplar=1&LAN=DE A1 Chengxiao, Yan A1 Owais, Jaweria A1 Ahmed, Awais A1 Khan, Muhammad Owais A1 Xiaoyang, Zeng A1 Tunio, Muhammad Hanif YR 2023 SN 2576-8964 K1 Surveys K1 Support vector machines K1 Systematics K1 Bibliographies K1 Predictive models K1 Market research K1 Wavelet analysis K1 Software defect prediction K1 Machine learning K1 Software quality K1 Testing phase K1 Software engineering K1 Data analysis SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/ICCWAMTIP60502.2023.10387043 DO https://doi.org/10.1109/ICCWAMTIP60502.2023.10387043 SF ELIB - SuUB Bremen
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