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Integrating Advanced Deep Learning Features with SVM for Pa..:

, In: 2023 IEEE 3rd International Conference on Applied Electromagnetics, Signal Processing, & Communication (AESPC),
Muduli, Debendra ; Sharma, Santosh Kumar ; Rath, Adyasha.. - p. 1-6 , 2023
Link: https://doi.org/10.1109/AESPC59761.2023.10390504