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1 Ergebnisse
1
Microdose Effect of SGT MOSFETs induced by Heavy Ions:
, In:
2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)
,
Chen, ZhuoJun
;
Xu, Jiang
;
Lei, ZeYu
.. - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICREED59404.2023.10390806
RT T1
2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)
: T1
Microdose Effect of SGT MOSFETs induced by Heavy Ions
UL https://suche.suub.uni-bremen.de/peid=ieee-10390806&Exemplar=1&LAN=DE A1 Chen, ZhuoJun A1 Xu, Jiang A1 Lei, ZeYu A1 Zhang, ChenChen A1 Wan, Xin YR 2023 K1 Electrodes K1 Degradation K1 MOSFET K1 Radiation effects K1 Current measurement K1 Logic gates K1 Ions K1 microdose effect K1 SGT MOSFETs K1 heavy ion irradiation K1 TCAD simulation K1 threshold voltage SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICREED59404.2023.10390806 DO https://doi.org/10.1109/ICREED59404.2023.10390806 SF ELIB - SuUB Bremen
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