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1 Ergebnisse
1
Single event upset sensitivity of medium-energy proton in X..:
, In:
2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)
,
Li, Yonghong
;
Liu, Yongneng
;
Bai, Yurong
... - p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICREED59404.2023.10390895
RT T1
2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)
: T1
Single event upset sensitivity of medium-energy proton in Xilinx 16nm MPSoC
UL https://suche.suub.uni-bremen.de/peid=ieee-10390895&Exemplar=1&LAN=DE A1 Li, Yonghong A1 Liu, Yongneng A1 Bai, Yurong A1 Lyu, Wei A1 He, Chaohui A1 Yang, Weitao A1 Li, Pei A1 Li, Ning A1 Li, Yang A1 Wang, Baichuan A1 Zhang, Xiaodong YR 2023 K1 Protons K1 Radiation effects K1 Sensitivity K1 Single event upsets K1 Random access memory K1 16nm MPSoC K1 medium-energy proton K1 single event upset K1 Configuration RAM SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICREED59404.2023.10390895 DO https://doi.org/10.1109/ICREED59404.2023.10390895 SF ELIB - SuUB Bremen
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