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Single event upset sensitivity of medium-energy proton in X..:

, In: 2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED),
Li, Yonghong ; Liu, Yongneng ; Bai, Yurong... - p. 1-4 , 2023
Link: https://doi.org/10.1109/ICREED59404.2023.10390895