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1 Ergebnisse
1
Single-Event Transient Effect and Hardness Design of DSD Po..:
, In:
2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)
,
Chen, ZhuoJun
;
Shuai, PengFei
- p. 1-4 , 2023
Link:
https://doi.org/10.1109/ICREED59404.2023.10390902
RT T1 <cTitle>2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED)</cTitle>: T1 <Title>Single-Event Transient Effect and Hardness Design of DSD Power Converter</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10390902&Exemplar=1&LAN=DE A1 Chen, ZhuoJun A1 Shuai, PengFei YR 2023 K1 Radiation effects K1 Low voltage K1 Electric potential K1 Radiation hardening (electronics) K1 Voltage K1 Transient analysis K1 Transconductance K1 double step-down (DSD) K1 point-of-load (PoL) K1 single-event effect K1 radiation hardened design SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICREED59404.2023.10390902 DO https://doi.org/10.1109/ICREED59404.2023.10390902 SF ELIB - SuUB Bremen
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