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1 Ergebnisse
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Common causes of long time to deal with 10kV capacitor defe..:
, In:
2023 IEEE 3rd International Conference on Data Science and Computer Application (ICDSCA)
,
Wenjing, Zhao
;
Ke, Du
;
Yajun, Fan
... - p. 226-229 , 2023
Link:
https://doi.org/10.1109/ICDSCA59871.2023.10393292
RT T1 <cTitle>2023 IEEE 3rd International Conference on Data Science and Computer Application (ICDSCA)</cTitle>: T1 <Title>Common causes of long time to deal with 10kV capacitor defects and corrective measures</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10393292&Exemplar=1&LAN=DE A1 Wenjing, Zhao A1 Ke, Du A1 Yajun, Fan A1 Jin, Li A1 Chongpeng, Guo A1 Lin, Chong YR 2023 K1 Reactive power K1 Substations K1 Capacitors K1 Companies K1 Maintenance engineering K1 Time measurement K1 Loss measurement K1 power capacitors K1 defect handling K1 Response measures K1 reliability SP 226 OP 229 LK http://dx.doi.org/https://doi.org/10.1109/ICDSCA59871.2023.10393292 DO https://doi.org/10.1109/ICDSCA59871.2023.10393292 SF ELIB - SuUB Bremen
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