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1
An automated method for detecting security chip faults:
, In:
2023 IEEE 6th International Conference on Information Systems and Computer Aided Education (ICISCAE)
,
Ding, Xian
;
Fu, Lili
;
Sun, Tao
... - p. 97-100 , 2023
Link:
https://doi.org/10.1109/ICISCAE59047.2023.10393676
RT T1 <cTitle>2023 IEEE 6th International Conference on Information Systems and Computer Aided Education (ICISCAE)</cTitle>: T1 <Title>An automated method for detecting security chip faults</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10393676&Exemplar=1&LAN=DE A1 Ding, Xian A1 Fu, Lili A1 Sun, Tao A1 Du, Jun A1 Yi, Ling A1 Ma, Bing YR 2023 SN 2770-663X K1 Analytical models K1 Codes K1 Fault detection K1 Computational modeling K1 Maintenance engineering K1 Software K1 Safety K1 Security chip K1 fault detection K1 automated detection K1 detection strategies SP 97 OP 100 LK http://dx.doi.org/https://doi.org/10.1109/ICISCAE59047.2023.10393676 DO https://doi.org/10.1109/ICISCAE59047.2023.10393676 SF ELIB - SuUB Bremen
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