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1 Ergebnisse
1
Analysis of Self-Organized Criticality in Complex Manufactu..:
, In:
2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
,
Zhang, Yulin
;
Yu, Qingyun
;
Ji, Pengcheng
.. - p. 3876-3881 , 2023
Link:
https://doi.org/10.1109/SMC53992.2023.10394160
RT T1 <cTitle>2023 IEEE International Conference on Systems, Man, and Cybernetics (SMC)</cTitle>: T1 <Title>Analysis of Self-Organized Criticality in Complex Manufacturing Systems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-10394160&Exemplar=1&LAN=DE A1 Zhang, Yulin A1 Yu, Qingyun A1 Ji, Pengcheng A1 Yu, Tingyi A1 Li, Li YR 2023 SN 2577-1655 K1 Semiconductor device modeling K1 Correlation coefficient K1 Uncertainty K1 Production K1 Semiconductor device manufacture K1 Complex systems K1 Manufacturing systems K1 Criticality K1 Complex manufacturing systems K1 Self-organized criticality theory K1 Principal component analysis K1 Pearson correlation coefficients SP 3876 OP 3881 LK http://dx.doi.org/https://doi.org/10.1109/SMC53992.2023.10394160 DO https://doi.org/10.1109/SMC53992.2023.10394160 SF ELIB - SuUB Bremen
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