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1 Ergebnisse
1
Investigation into the On-Resistance Shift Phenomenon of 65..:
, In:
2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
,
Yan, Xingyuan
;
Wang, Zhiqiang
;
Tao, Junbing
... - p. 120-124 , 2023
Link:
https://doi.org/10.1109/PEAS58692.2023.10394891
RT T1
2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
: T1
Investigation into the On-Resistance Shift Phenomenon of 650V Commercial GaN Power Devices with Different Structures
UL https://suche.suub.uni-bremen.de/peid=ieee-10394891&Exemplar=1&LAN=DE A1 Yan, Xingyuan A1 Wang, Zhiqiang A1 Tao, Junbing A1 Wu, Yunchan A1 Wang, Yifan A1 Xin, Guoqing A1 Shi, Xiaojie A1 Kang, Yong YR 2023 K1 Resistance K1 Soft switching K1 Switches K1 HEMTs K1 Threshold voltage K1 Power electronics K1 MODFETs K1 GaN power devices K1 on-resistance shift K1 reliability studies SP 120 OP 124 LK http://dx.doi.org/https://doi.org/10.1109/PEAS58692.2023.10394891 DO https://doi.org/10.1109/PEAS58692.2023.10394891 SF ELIB - SuUB Bremen
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