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1 Ergebnisse
1
Impact of Short-Circuit Events on the Threshold Voltage Ins..:
, In:
2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
,
Li, Kaiwei
;
Sun, Pengju
;
Ma, Xing
... - p. 1874-1878 , 2023
Link:
https://doi.org/10.1109/PEAS58692.2023.10395076
RT T1
2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)
: T1
Impact of Short-Circuit Events on the Threshold Voltage Instability of SiC MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-10395076&Exemplar=1&LAN=DE A1 Li, Kaiwei A1 Sun, Pengju A1 Ma, Xing A1 Huang, Xu A1 Li, Qiang A1 Chen, Lan YR 2023 K1 MOSFET K1 Temperature K1 Silicon carbide K1 Thermal variables control K1 Threshold voltage K1 Transistors K1 Stress K1 silicon carbide (SiC) K1 reliability K1 threshold voltage K1 short circuit (SC) K1 bias temperature instability (BTI) SP 1874 OP 1878 LK http://dx.doi.org/https://doi.org/10.1109/PEAS58692.2023.10395076 DO https://doi.org/10.1109/PEAS58692.2023.10395076 SF ELIB - SuUB Bremen
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